Determination of oxygen concentration in silicon and germanium by infrared absorption / W.R. Thurber.

Author/creator Thurber, W. Robert
Other author United States. National Bureau of Standards.
Other author Institute for Applied Technology (U.S.). Electronic Technology Division.
Format Book
Publication[Washington, D.C.] : National Bureau of Standards, 1970.
Description20 pages : illustrations ; 26 cm
Subjects

SeriesNBS technical note ; 529
NBS technical note ; 529. ^A4336
General noteElectronic Technology Division, Institute for Applied Technology.
General noteIssued May 1970.
General noteTables.
General noteGPO Historic Shelflist Project- publication not in hand.
General noteGPO Cataloging Record Distribution Program (CRDP).
Bibliography noteIncludes bibliographical references (pages 14-15).
GPO item number0249-A
Govt. docs number C 13.46:529