Determination of deep impurities in silicon and germanium by infrared photoconductivity / W. Robert Thurber.

Author/creator Thurber, W. Robert
Other author United States. National Bureau of Standards.
Format Book
Publication[Washington, D.C.] : National Bureau of Standards, 1971.
Description12 pages ; 26 cm
Subjects

SeriesNBS technical note ; 570
NBS technical note ; no. 570. ^A4336
General noteMarch 1971.
General noteGPO Historic Shelflist Project- publication not in hand.
General noteGPO Cataloging Record Distribution Program (CRDP).
Bibliography noteIncludes bibliographical references (pages 11-12).
GPO item number0249-A
Govt. docs number C 13.46:570