A technique for measuring the surface temperature of transistors by means of fluorescent phosphor / David J. Brenner.
| Author/creator | Brenner, David J. |
| Other author | Institute for Applied Technology (U.S.) |
| Other author | United States. National Bureau of Standards. |
| Other author | United States. Department of Commerce. |
| Format | Book |
| Publication | [Washington, D.C.] : National Bureau of Standards, 1971. |
| Description | iv, 46 pages : illustrations, charts ; 27 cm |
| Subjects |
| Series | United States. National Bureau of Standards. Technical note ; 591 |
| General note | Issued July 1971. |
| General note | GPO Historic Shelflist Project- publication not in hand. |
| General note | GPO Cataloging Record Distribution Program (CRDP). |
| Bibliography note | Includes bibliographical references (page 46). |
| GPO item number | 0249-A |
| Govt. docs number | C 13.46:591 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.46:591 | ✔ Available | Place Hold |