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001 ocm05371711;

003 OCoLC;

005 20230331144749.0;

008 790913s1979 dcu b f000 0 eng d;

019 a| 897959876;

049 a| ERE#;

050 4 a| QC100b| .U578 no., 1102;

074 a| 0249-A;

086 0 a| C 13.46:1102;

088 a| NBS TN 1102;

100 1 a| Leedy, T. F.0| https://id.loc.gov/authorities/names/n78081096e| author.=| ^A598143;

245 10 a| Large scale integration digital testing :b| annotated bibliography, 1969-1978 /c| Thomas F. Leedy ; Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.;

264 1 a| Washington, D.C. :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. Govt. Print. Off.,c| 1979.;

300 a| 40 pages in various pagings ;c| 27 cm;

336 a| textb| txt2| rdacontent;

337 a| unmediatedb| n2| rdamedia;

338 a| volumeb| nc2| rdacarrier;

490 1 a| NBS technical note ;v| 1102;

500 a| CODEN: NBTNAE.;

500 a| Issued Aug. 1979.;

500 a| GPO Historic Shelflist Project- publication not in hand.;

500 a| GPO Cataloging Record Distribution Program (CRDP).;

650 0 a| Transistorsx| Testing.=| ^A43650;

650 0 a| Integrated circuitsx| Testingv| Bibliography.=| ^A450737;

650 0 a| Semiconductorsx| Testingv| Bibliography.=| ^A65728;

655 7 a| Bibliographies.2| lcgft0| https://id.loc.gov/authorities/genreForms/gf2014026048;

830 0 a| NBS technical note ;0| https://id.loc.gov/authorities/names/n42033257v| 1102.=| ^A4336;

949 a| C 13.46:1102w| sudoch| joyner38;

596 a| 1;

998 a| 1010040;

999 a| C 13.46:1102w| SUDOCc| 1i| 30372013432957d| 9/21/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 9/21/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

Large scale integration digital testing : annotated bibliography, 1969-1978 / Thomas F. Leedy ; Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

Author/creator	Leedy, T. F. author.
Other author	Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division, issuing body.
Format	Book
Publication	Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
Description	40 pages in various pagings ; 27 cm
Subjects	Transistors--Testing. Integrated circuits--Testing. --Bibliography. Semiconductors--Testing. --Bibliography.

Series	NBS technical note ; 1102 NBS technical note ; https://id.loc.gov/authorities/names/n42033257 1102. ^A4336
General note	CODEN: NBTNAE.
General note	Issued Aug. 1979.
General note	GPO Historic Shelflist Project- publication not in hand.
General note	GPO Cataloging Record Distribution Program (CRDP).
Genre/form	Bibliographies.
Technical rpt number	NBS TN 1102
GPO item number	0249-A
Govt. docs number	C 13.46:1102

Large scale integration digital testing : annotated bibliography, 1969-1978 / Thomas F. Leedy ; Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

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