Combined effect of matrix cracking and stress-free edge on delamination / S.A. Salpekar and T.K. O'Brien.

Author/creator Salpekar, Satish A., 1954-
Other author O'Brien, T. Kevin.
Other author Langley Research Center.
Other author United States. Army Aviation Systems Command.
Format Microform
Publication InfoHampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [ St. Louis, MO] : US Army Aviation Systems Command, [1990]
Description64 p. : ill.
Supplemental Contenthttps://purl.fdlp.gov/GPO/LPS67326
Subjects

SeriesNASA technical memorandum ; 102591
AVSCOM technical memorandum ; 90-B-002
NASA technical memorandum 102591. ^A467613
AVSCOM technical memorandum ; 90-B-002. ^A437489
General noteCover title.
General noteShipping list no.: 90-0860-M.
General note"March 1990."
General noteGPO Cataloging Record Distribution Program (CRDP).
Bibliography noteIncludes bibliographical references (p. 30-32).
Other formsAlso available via Internet from the NASA Technical Report Server web site. Address as of 3/1/06: http://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/19900011810%5F1990011810.pdf; current access available via PURL.
Reproduction noteMicrofiche. [Washington, D.C.? : National Aeronautics and Space Administration, 1990] 1 microfiche : negative ; 11 x 15 cm.
GPO item number0830-D (MF)
GPO item number0830-D (online)
Govt. docs number NAS 1.15:102591
Stock numberN 90-21126 NASA

Availability

Library Location Call Number Status Item Actions
Joyner Microforms B300 NAS 1.15:102591 ✔ Available