Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster, W. Hofer.
| Author/creator | Foster, A., 1975- |
| Other author | Hofer, Werner, 1960- |
| Format | Book |
| Publication Info | New York : Springer Science+Business, ©2006. |
| Description | xiv, 281 pages : illustrations ; 25 cm. |
| Subjects |
| Series | Nanoscience and technology Nanoscience and technology. ^A683171 |
| Bibliography note | Includes bibliographical references and index. |
| LCCN | 2005936713 |
| ISBN | 0387400907 |
| ISBN | 9780387400907 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | General Stacks | QH212.S33 F68 2006 | ✔ Available | Place Hold |