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001 ocm71008043;

003 OCoLC;

005 20141211192559.0;

008 060818s2006 gw a b 001 0 eng d;

015 a| GBA6810992| bnb;

016 7 a| 97594228X2| GyFmDB;

016 7 a| 0133780882| Uk;

020 a| 3540284052 (hd.bd.);

020 a| 9783540284055;

029 0 a| OHXb| har050101670;

029 1 a| NLGGCb| 284784575;

035 a| (Sirsi) o71008043;

035 a| (OCoLC)71008043;

049 a| EREE;

072 7 a| QH2| lcco;

082 04 a| 502.822| 22;

090 a| QH212.A78b| K38 2006;

100 1 a| Kaupp, G.q| (Gerd)=| ^A703018;

245 10 a| Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching :b| application to rough and natural surfaces /c| G. Kaupp.;

260 a| Berlin :b| Springer-Verlag,c| 2006.;

300 a| xii, 292 pages :b| illustrations ;c| 24 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| Nanoscience and technology,x| 1434-4904;

504 a| Includes bibliographical references and index.;

650 0 a| Atomic force microscopy.=| ^A420766;

650 0 a| Near-field microscopy.=| ^A520775;

830 0 a| Nanoscience and technology.=| ^A683171;

994 a| 92b| ERE;

910 a| PromptCat;

938 a| Otto Harrassowitzb| HARRn| har050101670c| 96.25 EUR;

938 a| Baker & Taylorb| BKTYc| 119.00d| 119.00i| 3540284052n| 0006604896s| active;

980 a| 2006-11-15b| 119d| 0e| 99.96f| 5800;

596 a| 1;

998 a| 1062143;

999 a| QH212.A78 K38 2006w| LCc| 1i| 30372014163460d| 1/26/2007l| JGESm| JOYNERp| $99.96r| Ys| Yt| JGESBKu| 11/27/2006x| BOOKz| JSTACKSo| .STAFF. 0;

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp.

Author/creator	Kaupp, G.
Format	Book
Publication Info	Berlin : Springer-Verlag, 2006.
Description	xii, 292 pages : illustrations ; 24 cm.
Subjects	Atomic force microscopy. Near-field microscopy.

Series	Nanoscience and technology, 1434-4904 Nanoscience and technology. ^A683171
Bibliography note	Includes bibliographical references and index.
ISBN	3540284052 (hd.bd.)
ISBN	9783540284055

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Library	Location	Call Number	Status	Item Actions
Joyner	General Stacks	QH212.A78 K38 2006	✔ Available	Place Hold

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp.

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