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005 20151103143318.0;

008 050510s2005 enkaf b 001 0 eng ;

010 a| 2006462720;

015 a| GBA5426962| bnb;

016 7 a| 0132008432| Uk;

019 a| 122334926a| 149231618;

020 a| 052184875X;

020 a| 9780521848756;

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029 1 a| NZ1b| 9478368;

029 1 a| YDXCPb| 100368456;

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035 a| (Sirsi) o60419337;

035 a| (OCoLC)60419337z| (OCoLC)122334926z| (OCoLC)149231618;

037 a| 36777b| TVG;

042 a| ukblsr;

049 a| NPEE;

050 00 a| QE440b| .R43 2005;

082 04 a| 552.82| 22;

082 04 a| 502.8250245532| 22;

100 1 a| Reed, S. J. B.=| ^A74363;

245 10 a| Electron microprobe analysis and scanning electron microscopy in geology /c| S.J.B. Reed.;

250 a| 2nd ed.;

300 a| xiii, 189 pages, 7 unnumbered pages of plates :b| illustrations (some color) ;c| 26 cm;

336 a| textb| txt2| rdacontent;

337 a| unmediatedb| n2| rdamedia;

338 a| volumeb| nc2| rdacarrier;

500 a| Previous edition: 1996.;

504 a| Includes bibliographical references and index.;

505 0 a| 1. Introduction -- 2. Electron-specimen interactions -- 3. Instrumentation -- 4. Scanning electron microscopy -- 5. X-ray spectrometers -- 6. Element mapping -- 7. X-ray analysis (1) -- 8. X-ray analysis (2) -- 9. Sample preparation.;

520 1 a| "Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories."--Cover.;

650 0 a| Petrofabric analysis.=| ^A22035;

650 0 a| Electron probe microanalysis.=| ^A961;

650 0 a| Scanning electron microscopy.=| ^A300154;

655 7 a| Electron probe microanalysis.2| fast0| (OCoLC)fst00906704;

655 7 a| Petrofabric analysis.2| fast0| (OCoLC)fst01059247;

655 7 a| Scanning electron microscopy.2| fast0| (OCoLC)fst01106480;

856 41 3| Table of contentsu| http://catdir.loc.gov/catdir/enhancements/fy0668/2006462720-t.html;

856 42 3| Publisher descriptionu| http://catdir.loc.gov/catdir/enhancements/fy0668/2006462720-d.html;

938 a| Baker & Taylorb| BKTYc| 75.00d| 75.00i| 052184875Xn| 0006132422s| active;

938 a| Baker and Taylorb| BTCPn| BK0006132422;

938 a| YBP Library Servicesb| YANKn| 100368456;

949 a| QE440 .R43 2005w| LCi| 305131066702Yh| ENPE6o| 360699;

994 a| C0b| NPE;

590 a| Little--360699--305131066702Y;

590 a| Little-360699--305131066702Y;

596 a| 1 2;

998 a| 1067965;

999 a| QE440 .R43 2005w| LCc| 1i| 30372014077181d| 4/13/2015e| 12/15/2014l| JGESm| JOYNERn| 3p| $70.00r| Ys| Yt| JGESBKu| 1/22/2007x| BOOKz| JSTACKSo| .STAFF. 0;

Electron microprobe analysis and scanning electron microscopy in geology / S.J.B. Reed.

Author/creator	Reed, S. J. B.
Format	Book
Edition	2nd ed.
Publication Info	Cambridge : Cambridge University Press, ©2005.
Description	xiii, 189 pages, 7 unnumbered pages of plates : illustrations (some color) ; 26 cm
Supplemental Content	Table of contents
Supplemental Content	Publisher description
Subjects	Petrofabric analysis. Electron probe microanalysis. Scanning electron microscopy.

Contents	1. Introduction -- 2. Electron-specimen interactions -- 3. Instrumentation -- 4. Scanning electron microscopy -- 5. X-ray spectrometers -- 6. Element mapping -- 7. X-ray analysis (1) -- 8. X-ray analysis (2) -- 9. Sample preparation.
Review	"Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories."--Cover.
Local note	Little--360699--305131066702Y
Local note	Little-360699--305131066702Y
General note	Previous edition: 1996.
Bibliography note	Includes bibliographical references and index.
Genre/form	Electron probe microanalysis.
Genre/form	Petrofabric analysis.
Genre/form	Scanning electron microscopy.
LCCN	2006462720
ISBN	052184875X
ISBN	9780521848756
Stock number	36777 TVG

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Joyner	General Stacks	QE440 .R43 2005	✔ Available	Place Hold

Electron microprobe analysis and scanning electron microscopy in geology / S.J.B. Reed.

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