Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride / George Y. Baaklini, James D. Kiser, and Don J. Roth.
| Author/creator | Baaklini, George Y. |
| Other author | Kiser, James D. |
| Other author | Roth, Don J. |
| Other author | United States. National Aeronautics and Space Administration. |
| Format | Microform |
| Publication Info | [Washington, D.C.] : National Aeronautics and Space Administration, [1985] |
| Description | 1 volume. |
| Series | NASA technical memorandum ; 86945 NASA technical memorandum 86945. ^A467613 |
| Reproduction note | Joyner- Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1985. 1 microfiche. |
| GPO item number | 0830-D (MF) |
| Govt. docs number | NAS 1.15:86945 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | NAS 1.15:86945 | ✔ Available |