New horizons in testing : latent trait test theory and computerized adaptive testing / edited by David J. Weiss ; contributors, R. Darrell Bock [and others].

Format Book
Publication InfoNew York : Academic Press, 1983.
Descriptionxvii, 345 pages : illustrations ; 24 cm
Subjects
Psychological tests--Congresses.

Other author/creatorWeiss, David J.
Other author/creatorBock, R. Darrell.
Other author/creatorUnited States. Office of Naval Research.
Other author/creatorComputerized Adaptive Testing Conference (1979 : Wayzata, Minn.)
General noteDerived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al.
Bibliography noteIncludes bibliographies and indexes.
LCCN 82024374
ISBN0127427805 (alk. paper)

Availability

Library Location Call Number Status Item Actions
Joyner General Stacks BF176 .N48 1983 ✔ Available Place Hold