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074 a| 0430-P-04 (online);

086 0 a| E 9.17:NREL/CP-5200-48393;

245 04 a| The use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells /c| D.S. Albin ... [et al.].;

246 30 a| Use of second and third level correlation analysis for studying degradation in polycrystalline thin film solar cells;

260 a| [Golden, CO] :b| National Renewable Energy Laboratory,c| [2011];

300 a| 1 online resource (7 p.) :b| col. ill.;

336 a| textb| txt2| rdacontent;

337 a| computerb| c2| rdamedia;

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490 1 a| NREL/CP ;v| 5200-48393;

500 a| Title from title screen (viewed March 21, 2011).;

500 a| "March 2011.";

500 a| "Presented at the 35th IEEE Photovoltaic Specialists Conference (PVSC '10), Honolulu, Hawaii, June 20-25, 2010.";

500 a| GPO Cataloging Record Distribution Program (CRDP).;

504 a| Includes bibliographical references (p. 6-7).;

536 b| DE-AC36-08GO28308;

650 0 a| Photovoltaic cellsx| Research.=| ^A367896;

650 0 a| Solar cellsx| Testing.=| ^A134721;

650 0 a| Thin films.=| ^A26073;

700 1 a| Albin, David S.=| ^A755829;

710 2 a| National Renewable Energy Laboratory (U.S.)=| ^A367790;

711 2 a| IEEE Photovoltaic Specialists Conferenced| (2010 :c| Honolulu, Hawaii)?| UNAUTHORIZED;

830 0 a| Conference paper (National Renewable Energy Laboratory (U.S.)) ;v| 5200-48393.=| ^A755847;

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999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 2473317-1001l| JNETm| JOYNERr| Ys| Yt| JNE1DOu| 5/11/2011x| EDOCUMENTz| JERESOURCE;

The use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells / D.S. Albin ... [et al.].

Other author	Albin, David S.
Other author	National Renewable Energy Laboratory (U.S.)
Other author	IEEE Photovoltaic Specialists Conference (2010 : Honolulu, Hawaii)
Format	Electronic
Publication Info	[Golden, CO] : National Renewable Energy Laboratory, [2011]
Description	1 online resource (7 p.) : col. ill.
Supplemental Content	https://purl.fdlp.gov/GPO/gpo5980
Subjects	Photovoltaic cells--Research. Solar cells--Testing. Thin films.

Portion of title	Use of second and third level correlation analysis for studying degradation in polycrystalline thin film solar cells
Series	NREL/CP ; 5200-48393 Conference paper (National Renewable Energy Laboratory (U.S.)) ; 5200-48393. ^A755847
General note	Title from title screen (viewed March 21, 2011).
General note	"March 2011."
General note	"Presented at the 35th IEEE Photovoltaic Specialists Conference (PVSC '10), Honolulu, Hawaii, June 20-25, 2010."
General note	GPO Cataloging Record Distribution Program (CRDP).
Bibliography note	Includes bibliographical references (p. 6-7).
Funding information	DE-AC36-08GO28308
GPO item number	0430-P-04 (online)
Govt. docs number	E 9.17:NREL/CP-5200-48393

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The use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells / D.S. Albin ... [et al.].

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