Capacitance cell measurement of the out-of-plane expansion of thin films / Chad R. Snyder, Frederick I. Mopsik.
| Author/creator | Snyder, Chad R. |
| Other author | Mopsik, Frederick I. |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Electronic |
| Publication Info | [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001] |
| Description | 1 online resource (x, 32 pages) : illustrations. |
| Supplemental Content | http://purl.fdlp.gov/GPO/gpo6356 |
| Subjects |
| Series | NIST special publication ; no. 960-7 NIST recommended practice guide NIST recommended practice guide. ^A489824 NIST special publication no. 960-7. ^A390056 |
| General note | Title from title screen (viewed Apr. 19, 2011). |
| General note | "November 2001." |
| General note | "CODEN: NSPUE2." |
| Bibliography note | Includes bibliographical references (p. 31-32). |
| Issued in other form | Paper version: Snyder, Chad R. Capacitance cell measurement of the out-of-plane expansion of thin films. |
| GPO item number | 0247 (online) |
| Govt. docs number | C 13.10:960-7 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |