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001 ocn770094013;

003 OCoLC;

005 20141212080332.0;

006 m d f ;

007 cr mn|||||||||;

008 120103s2011 mdua obt f000 0 eng d;

035 a| (Sirsi) o770094013;

040 a| GPOc| GPOd| UtOrBLW;

049 a| ERE#;

074 a| 0324-A-01 (online);

086 0 a| D 101.133:5435;

100 1 a| Potrepka, Daniel M.?| UNAUTHORIZED;

245 10 a| Modeling ellipsometry for SrTiO3 MBE epitaxial films on Si(100) /c| Daniel M. Potrepka.;

260 a| Adelphi, MD :b| Army Research Laboratory,c| [2011];

300 a| 1 online resource (vi, 12 pages) :b| color illustrations.;

336 a| text2| rdacontent;

337 a| computer2| rdamedia;

338 a| online resource2| rdacarrier;

490 1 a| ARL-TR ;v| 5435;

513 a| Summary;b| May to September 2010.;

500 a| Title from title screen (viewed on Jan. 3, 2012).;

500 a| "January 2011.";

504 a| Includes bibliographical references (p. 10).;

650 0 a| Strontium compounds.=| ^A965455;

650 0 a| Silicon.=| ^A62410;

650 0 a| Epitaxy.=| ^A246052;

710 2 a| U.S. Army Research Laboratory.=| ^A367731;

776 08 i| Print version:a| Potrepka, Daniel M.t| Modeling ellipsometry for SrTiO3 MBE epitaxial films on Si(100)w| (OCoLC)770095387;

830 0 a| ARL-TR (Aberdeen Proving Ground, Md.) ;v| 5435.=| ^A566074;

856 40 u| https://purl.fdlp.gov/GPO/gpo17207;

949 a| Click on web addressw| ASISh| JOYNER94;

998 a| 2686333;

998 a| u2686333;

596 a| 1;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 2686333-1001l| JNETm| JOYNERr| Ys| Yt| JNE1DOu| 2/16/2012x| EDOCUMENTz| JERESOURCE;

Modeling ellipsometry for SrTiO3 MBE epitaxial films on Si(100) / Daniel M. Potrepka.

Author/creator	Potrepka, Daniel M.
Other author	U.S. Army Research Laboratory.
Format	Electronic
Publication Info	Adelphi, MD : Army Research Laboratory, [2011]
Description	1 online resource (vi, 12 pages) : color illustrations.
Supplemental Content	https://purl.fdlp.gov/GPO/gpo17207
Subjects	Strontium compounds. Silicon. Epitaxy.

Series	ARL-TR ; 5435 ARL-TR (Aberdeen Proving Ground, Md.) ; 5435. ^A566074
General note	Title from title screen (viewed on Jan. 3, 2012).
General note	"January 2011."
Bibliography note	Includes bibliographical references (p. 10).
Report note	Summary; May to September 2010.
Issued in other form	Print version: Potrepka, Daniel M. Modeling ellipsometry for SrTiO3 MBE epitaxial films on Si(100)
GPO item number	0324-A-01 (online)
Govt. docs number	D 101.133:5435

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