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001 ocm14167913;

005 20141212011303.0;

008 860814s1987 maua b 000 0 eng ;

010 a| 86020892;

020 a| 0898381851 :c| $35.95;

035 a| (Sirsi) o14167913;

035 a| (OCoLC)14167913;

049 a| EREE;

050 00 a| TK7874b| .S533 1987;

082 0 a| 621.3952| 19;

100 1 a| Singh, Narinder,d| 1956-=| ^A211351;

245 13 a| An artificial intelligence approach to test generation /c| by Narinder Singh.;

300 a| x, 193 pages :b| illustrations ;c| 25 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| The Kluwer international series in engineering and computer science ;v| SECS 19;

504 a| Bibliography: p. [189]-193.;

650 0 a| Expert systems (Computer science)=| ^A144659;

650 0 a| Artificial intelligence.=| ^A15394;

830 0 a| Kluwer international series in engineering and computer sciencev| SECS 19.=| ^A664937;

919 a| BOOK;

596 a| 1;

998 a| 292892;

999 a| TK7874 .S533 1987w| LCc| 1i| 30372004408248d| 4/3/2013e| 9/22/1993f| 4/3/2013g| 3l| JGESm| JOYNERr| Ys| Yt| JGESBKu| 2/27/1989x| BOOKz| JSTACKSo| .STAFF. 0o| .STAFF. Copy Statement : c.1;

An artificial intelligence approach to test generation / by Narinder Singh.

Author/creator	Singh, Narinder, 1956-
Format	Book
Publication Info	Boston : Kluwer Academic Publishers, ©1987.
Description	x, 193 pages : illustrations ; 25 cm.
Subjects	Integrated circuits--Very large scale integration. --Testing. --Data processing. Expert systems (Computer science) Artificial intelligence.

Series	The Kluwer international series in engineering and computer science ; SECS 19 Kluwer international series in engineering and computer science SECS 19. ^A664937
Bibliography note	Bibliography: p. [189]-193.
LCCN	86020892
ISBN	0898381851 :

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Library	Location	Call Number	Status	Item Actions
Joyner	General Stacks	TK7874 .S533 1987	✔ Available	Place Hold

An artificial intelligence approach to test generation / by Narinder Singh.

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