Yield simulation for integrated circuits / by Duncan Moore Henry Walker.

Author/creator Walker, Duncan Moore Henry
Format Book
Publication InfoBoston : Kluwer Academic Publishers, ©1987.
Descriptionx, 209 pages : illustrations ; 25 cm.
Subjects
Integrated circuits--Very large scale integration. --Design and construction. --Mathematical models.
Integrated circuits--Very large scale integration. --Design and construction. --Data processing.
Integrated circuits--Very large scale integration. --Defects. --Mathematical models.
Integrated circuits--Very large scale integration. --Defects. --Data processing.
Monte Carlo method.

SeriesKluwer international series in engineering and computer science. VLSI, compter architecture, and digital signal processing
General noteBased on author's thesis (Ph. D.).
General noteIncludes index.
Bibliography noteBibliography: p. [189]-206.
LCCN 87017302
ISBN0898382440

Availability

Library Location Call Number Status Item Actions
Joyner General Stacks TK7874 .W34 1987 ✔ Available Place Hold