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003 OCoLC;

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008 121107s2012 vaua obt f000 0 eng d;

040 a| GPOc| GPOd| MvI;

049 a| ERE#;

074 a| 0830-D (online);

086 0 a| NAS 1.15:2012-217597;

245 00 a| Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate /c| Hyun Jung Kim ... [et al.].;

246 3 a| Transmission electron microscopy (TEM) sample preparation of Si1-xGex in c-plane sapphire substrate;

260 a| Hampton, Va. :b| National Aeronautics and Space Administration, Langley Research Center,c| [2012];

300 a| 1 online resource (ix, 29 p.) :b| ill. (some col.);

336 a| textb| txt2| rdacontent;

337 a| computerb| c2| rdamedia;

338 a| online resourceb| cr2| rdacarrier;

490 1 a| NASA/TM ;v| 2012-217597;

500 a| Title from title screen (viewed on Nov. 7, 2012).;

500 a| "August 2012.";

500 a| GPO Cataloging Record Distribution Program (CRDP).;

504 a| Includes bibliographical references (p. 29).;

536 a| Sponsored by National Aeronautics and Space Administrationh| 392259.02.07.9923.11;

536 d| L-20166;

650 7 a| Ion beams.2| nasat;

650 7 a| Sapphire.2| nasat;

650 7 a| Transmission electron microscopy.2| nasat;

650 7 a| X-ray diffraction.2| nasat;

650 7 a| Single crystals.2| nasat;

650 7 a| Rhombohedrons.2| nasat;

650 7 a| Germanium.2| nasat;

650 7 a| Density measurement.2| nasat;

650 7 a| Crystal structure.2| nasat;

700 1 a| Kim, Hyŏn-jŏng.?| UNAUTHORIZED;

710 2 a| Langley Research Center.=| ^A192893;

830 0 a| NASA technical memorandumv| 2012-217597.=| ^A467613;

856 40 u| https://purl.fdlp.gov/GPO/gpo30968;

949 a| Click on web addressw| asish| joyner94;

596 a| 1;

998 a| 3155884;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 3155884-1001l| JNETm| JOYNERr| Ys| Yt| JNE1DOu| 12/14/2012x| EDOCUMENTz| JERESOURCE;

Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate / Hyun Jung Kim ... [et al.].

Other author	Kim, Hyŏn-jŏng.
Other author	Langley Research Center.
Format	Electronic
Publication Info	Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]
Description	1 online resource (ix, 29 p.) : ill. (some col.)
Supplemental Content	https://purl.fdlp.gov/GPO/gpo30968

Variant title	Transmission electron microscopy (TEM) sample preparation of Si1-xGex in c-plane sapphire substrate
Series	NASA/TM ; 2012-217597 NASA technical memorandum 2012-217597. ^A467613
General note	Title from title screen (viewed on Nov. 7, 2012).
General note	"August 2012."
General note	GPO Cataloging Record Distribution Program (CRDP).
Bibliography note	Includes bibliographical references (p. 29).
Funding information	Sponsored by National Aeronautics and Space Administration 392259.02.07.9923.11
Funding information	L-20166
GPO item number	0830-D (online)
Govt. docs number	NAS 1.15:2012-217597

Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate / Hyun Jung Kim ... [et al.].

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