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082 10 a| 621.392| 131| https://id.oclc.org/worldcat/ddc/E3vWdFbkgPVtYRBKf3tH7XCC9J;

130 0 a| IEEE design & test of computers (Online)?| UNAUTHORIZED;

210 0 a| IEEE des. test comput.b| (Online);

222 0 a| IEEE design & test of computersb| (Online);

245 10 a| IEEE design & test of computersh| [electronic resource] /c| IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc.;

246 30 a| IEEE design and test of computers;

246 30 a| Design & test of computers;

246 30 a| Design and test of computers;

246 30 a| IEEE design and test;

246 1 i| Some providers use title:a| Design & test of computers, IEEE;

246 17 a| IEEE design & test;

260 a| Los Alamitos, CA :b| IEEE Computer Society,c| 1984-2012.;

310 a| Bimonthly,b| 2001-;

321 a| Quarterly,b| Mar. 1991-;

321 a| Bimonthly,b| Feb. 1988-Dec. 1990;

362 1 a| Began with: Vol. 1, no. 1 (Feb. 1984); ceased with: Vol. 29, no. 6 (Nov./Dec. 2012).;

506 a| Available only to authorized users.;

530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

588 a| Description based on: Vol. 5, no. 1 (Feb. 1988); title from IEEExplore homepage (viewed Jun. 29, 2000).;

588 a| Latest issue consulted: Vol. 29, no. 6 (Nov./Dec. 2012) (IEEE Xplore, viewed Oct. 30, 2013).;

650 0 a| Computer engineeringv| Periodicals.=| ^A1236874;

650 0 a| Electronic digital computersx| Testingv| Periodicals.=| ^A17286;

655 0 a| Electronic journals.=| ^A353035;

710 2 a| IEEE Computer Society.1| https://id.oclc.org/worldcat/entity/E39QQPVp7YRxjbcrXVPYHxVD3F.=| ^A53823;

710 2 a| Institute of Electrical and Electronics Engineers.1| https://id.oclc.org/worldcat/entity/E39QH7JmppbjgFY6j8mDDMWwRg.=| ^A9546;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

785 00 t| IEEE design & test (Online)x| 2168-2364w| (DLC) 2012200562w| (OCoLC)795368469;

856 40 z| Click here for full textu| http://JW3MH2CM6N.search.serialssolutions.com/?V=1.0&L=JW3MH2CM6N&S=JCs&C=IEEEDESTE&T=marc;

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IEEE design & test of computers / IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc.

Other author	IEEE Computer Society.
Other author	Institute of Electrical and Electronics Engineers.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Los Alamitos, CA : IEEE Computer Society, 1984-2012.
Supplemental Content	Click here for full text
Subjects	Computer engineering--Periodicals. Electronic digital computers--Testing. --Periodicals.

Uniform title	IEEE design & test of computers (Online)
Portion of title	IEEE design and test of computers
Portion of title	Design & test of computers
Portion of title	Design and test of computers
Portion of title	IEEE design and test
Variant title	Some providers use title: Design & test of computers, IEEE
Running title	IEEE design & test
Frequency	Bimonthly, 2001-
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Source of description	Description based on: Vol. 5, no. 1 (Feb. 1988); title from IEEExplore homepage (viewed Jun. 29, 2000).
Source of description	Latest issue consulted: Vol. 29, no. 6 (Nov./Dec. 2012) (IEEE Xplore, viewed Oct. 30, 2013).
Succeeding title	IEEE design & test (Online) 2168-2364
Issued in other form	Print version: IEEE design & test of computers 0740-7475
Genre/form	Electronic journals.
LCCN	2005215229
ISSN	1558-1918
Stock number	IEEE Service Center, 445 Hoes Lane, PO Box 1331, Piscataway, NJ 08855-1331

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	Electronic Resources	Access Content Online	✔ Available

IEEE design & test of computers / IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc.

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