Journal of electronic testing
| Other author | IEEE Computer Society. Technical Council on Test Technology. |
| Format | Electronic |
| Publication Info | 1990- : [Dordrecht] : Kluwer Academic Publishers, ℗♭1990- |
| Publication Info | <2009-> : [Dordrecht] : Springer Netherlands |
| Supplemental Content | Click here for full text |
| Subjects |
| Uniform title | Journal of electronic testing (Online) |
| Variant title | Journal of electronic testing, theory and applications |
| Frequency | Bimonthly |
| Access restriction | Available only to authorized users. |
| Other forms | Also available in print. |
| Technical details | Mode of access: World Wide Web. |
| Issuing body | A journal serving electronic test professionals in concurrence with the Test Technology technical council (TTTC) of the IEEE Computer Society, <2010-> |
| Source of description | Vol. 1, no. 1 (Feb. 1990); title from journal information screen (SpringerLink, viewed Nov. 12, 2009). |
| Source of description | Vol. 35, no. 3 (June 2019) (Springer Link, viewed Aug. 21, 2019). |
| Issued in other form | Print version: Journal of electronic testing 0923-8174 |
| Genre/form | Electronic journals. |
| LCCN | 2004229188 |
| ISSN | 1573-0727 |
| Stock number | Kluwer Academic Publishers, Spuiboulevard 50, P.O. Box 17, 3300 AA Dordrecht, The Netherlands |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |