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588 1 a| 21st (2015) (IEEE Xplore, viewed September 16, 2020).;

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650 0 a| Error-correcting codes (Information theory)v| Congresses.=| ^A24917;

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Proceedings / IEEE International On-Line Testing Symposium.

Author/creator	IEEE International On-Line Testing Symposium
Other author	Institute of Electrical and Electronics Engineers.
Other author	IEEE Computer Society. Technical Council on Test Technology.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Los Alamitos, Calif. : IEEE Computer Society, ℗♭2003-
Supplemental Content	Click here for full text
Subjects	Electronic circuits--Testing. --Congresses. Online data processing--Congresses. Electronic circuit design--Congresses. Error-correcting codes (Information theory)--Congresses.

Uniform title	Proceedings (Online)
Portion of title	IOLTS
Frequency	Annual
General note	Title from PDF of original t.p. (IEEE Xplore, viewed May 24, 2007).
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Issuing body	Sponsored by: IEEE Computer Society Test Technology Technical Council.
Source of description	21st (2015) (IEEE Xplore, viewed September 16, 2020).
Preceding title	IEEE International On-Line Testing Workshop. Proceedings (Online). Proceedings
Succeeding title	IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Genre/form	Electronic journals.
LCCN	2007242231
ISSN	1942-9401 1530-1591
Stock number	IEEE Computer Society, 10662 Los Vaqueros Circle, PO Box 3014, Los Alamitos, CA 90720-1314

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Proceedings / IEEE International On-Line Testing Symposium.

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