1991 proceedings / International Conference on Wafer Scale Integration, January 29-31, 1991, Fairmont Hotel, San Francisco, California, USA ; sponsored by IEEE Computer Society, IEEE Components, Hybrids, and Manufacturing Technology Society ; edited by Michael J. Little and Vijay K. Jain.

Author/creator International Conference on Wafer Scale Integration
Format Electronic
Publication InfoLos Alamitos, Calif. : The Society,
Descriptionxiv, 342 p. : ill. ; 23 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Conference Proceedings Archive
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects

Other author/creatorLittle, Michael J.
Other author/creatorJain, Vijay K.
Other author/creatorIEEE Computer Society.
Other author/creatorIEEE Components, Hybrids, and Manufacturing Technology Society.
Other author/creatorIEEE Xplore (Online service)
General noteCover title: 1991 IEEE International Conference on Wafer Scale Integration.
General note"IEEE catalog number 91CH2943-9."
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
Other title1991 IEEE International Conference on Wafer Scale Integration.
LCCN 90085847
ISBN0818691263 (case)
ISBN0780300807 (lib. bdg.)
ISBN0818661267 (microfiche)