1995 International Integrated Reliability Workshop final report Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
| Author/creator | International Integrated Reliability Workshop |
| Other author | IEEE Electron Devices Society. |
| Other author | IEEE Reliability Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | [New York] : IEEE Electron Devices Society : IEEE Reliability Society, |
| Description | v, 24, 173 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| General note | "IEEE Catalog No. 94TH8086." |
| Bibliography note | Includes bibliographical references. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 95077004 |
| ISBN | 0780327055 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |