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1997 IEEE International Integrated Reliability Workshop final report Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
| Author/creator | International Integrated Reliability Workshop |
| Other author | IEEE Electron Devices Society. |
| Other author | IEEE Reliability Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, New Jersey : IEEE Electron Devices Society : IEEE Reliability Society, |
| Description | v, 161 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| General note | "IEEE Catalog No. 97TH8319"--verso of T.p. |
| Bibliography note | Includes bibliographical references. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 97080028 |
| ISBN | 0780342054 (softbound) |
| ISBN | 0780342062 (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |