2009 27th IEEE VLSI Test Symposium proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009 / [sponsored by] IEEE Computer Society.
| Author/creator | IEEE VLSI Test Symposium |
| Other author | IEEE Computer Society. Test Technology Technical Committee. |
| Other author | Institute of Electrical and Electronics Engineers. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | xxvii, 341 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Subjects |
| Variant title | 27th IEEE VLSI Test Symposium |
| Portion of title | VLSI Test Symposium |
| Variant title | VTS2009 |
| General note | "IEEE Computer Society Order Number P3598"--T.p. verso. |
| General note | "BMS part no. CFP09029-PRT"--T.p. verso. |
| General note | Other issues for 2001- are cataloged as a serial in LC. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2010275443 |
| ISBN | 9780769535982 |
| ISBN | 0769535984 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |