2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems

Author/creator ieee
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoPiscataway : IEEE
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
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Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9781424484478
ISBN1424484472 (Trade Paper) On Demand
Stock number00013077

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Electronic Resources ✔ Available