Asian Test Symposium Proceedings, 8th Asian Test Symposium, Shanghai, China 1999
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 400 p. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation As the general co-chairs of the Asian Test Symposium (ATS) note in their opening message, the continued shrinking of the device dimensions has caused testing to become even more important in VLSI technology. These ATS proceedings from the November 1999 conference include sessions on delay fault and memory test; test generation, diagnosis, and verification; IDDQ test; sequential circuit test; scan and boundary scan; and special sessions on railway signaling software testing and beam testing in Japan. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9780769503158 |
| ISBN | 0769503152 (Trade Paper) Active Record |
| Standard identifier# | 9780769503158 |
| Stock number | 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |