Atomic force microscopy understanding basic modes and advanced applications / Greg Haugstad.

Author/creator Haugstad, Greg, 1963-
Format Electronic
Publication InfoHoboken, N.J. : John Wiley & Sons,
Descriptionxxii, 464 p. : ill. ; 25 cm.
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects

Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2012003429
ISBN9780470638828

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available