Handbook of nanoscopy / edited by Gustaaf Van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycook.

Other author Tendeloo, G. Van (Gustaaf)
Other author Van Dyck, Dirk.
Other author Pennycook, Stephen J.
Format Electronic
Publication InfoWeinheim, Germany : Wiley-VCH,
Description2 v. (xxx, 1380 p.) : ill. (some col.) ; 25 cm.
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects
Microscopy.
Nanotechnology.

Contents v.1. The past, the present, and the future of nanoscopy / Gustaav Van Tendeloo and Dirk Van Dyck -- Transmission electron microscopy / Marc De Graef -- Atomic resolution electron microscopy / Dirk Van Dyck -- Ultrahigh-resolution transmission electron microscopy at negative spherical aberration / Knut W. Urban ... [et al.] -- Z-contrast imaging / Stephen J. Pennycook ... [et al.] -- Electron holography / Hannes Lichte -- Lorentz microscopy and electron holography of magnetic materials / Rafal E. Dunin-Borkowski ... [et al.] -- Electron tomography / Paul Anthony Midgley and Sara Bals -- Statistical parameter estimation theory - a tool for quantitative electron microscopy / Sandra Van Aert -- Dynamic transmission electron microscopy / Nigel D. Browning ... [et al.] -- Transmission electron microscopy as nanolab / Frans D. Tichelaar, Marijn A. van Huis, and Henny W. Zandbergen -- Atomic-resolution environmental transmission electron microscopy / Pratibha L. Gai and Edward D. Boyes -- Speckles in images and diffraction patterns / Michael M. J. Treacy -- Coherent electron diffractive imaging / J.M. Zuo and Weijie Huang -- Sample preparation techniques for transmission electron microscopy / Vasfi Burak Özdöl, Vesna Srot, and Peter A. van Aken -- Scanning probe microscopy - history, background, and state of the art / Ralf Heiderhoff and Ludwig Josef Balk -- Scanning probe microscopy--forces and currents in the nanoscale world / Brian J. Rodriguez ... [et al.] -- Scanning beam methods / David Joy -- Fundamentals of the focused ion beam system / Nan Yao.
Contents v.2. Low-energy electron microscopy / Ernst Bauer -- Spin-polarized low-energy electron microscopy / Ernst Bauer -- Imaging secondary ion mass spectroscopy / Katie L. Moore, Markus Schröder, and Chris R. M. Grovenor -- Soft x-ray imaging and spectromicroscopy / Adam P. Hitchcock -- Atom probe tomography: principle and applications / Frederic Danoix and François Vurpillot -- Signal and noise maximum likelihood estimation in MRI / Jan Sijbers -- 3-D surface reconstruction from stereo scanning electron microscopy images / Shafik Huq, Andreas Koschan, and Mongi Abidi -- Nanoparticles / Miguel López-Haro ... [et al.] -- Nanowires and nanotubes / Yong Ding and Zhong Lin Wang -- Carbon nanoforms / Carla Bittencourt and Gustaaf Van Tendeloo -- Metals and alloys / Dominique Schryvers -- In situ transmission electron microscopy on metals / J.Th.M. De Hosson -- Semiconductors and semiconducting devices / Hugo Bender -- Complex oxide materials / Maria Varela ... [et al.] -- Application of transmission electron microscopy in the research of inorganic photovoltaic materials / Yanfa Yan -- Polymers / Joachim Loos -- Ferroic and multiferroic materials / Ekhard Salje -- Three-dimensional imaging of biomaterials with electron tomography / Montserrat Bárcena, Roman I. Koning, and Abraham J. Koster -- Small organic molecules and higher homologs / Ute Kolb and Tatiana E. Gorelik.
Bibliography noteIncludes bibliographical references.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2012418090
ISBN9783527317066 (print : alk. paper)
ISBN3527317066 (print : alk. paper)

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