IWSM 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu / [sponsored by] IEEE Electron Devices Society.

Author/creator International Workshop on Statistical Metrology
Other author IEEE Electron Devices Society.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoPiscataway, New Jersey : IEEE ; Gaithersburg, Maryland : Widerkehr and Associates,
Descriptionvi, 121 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Conference Proceedings Archive
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Semiconductors--Characterization. --Statistical methods. --Congresses.
Semiconductors--Measurement. --Congresses.

Variant title Workshop on statistical metrology
Variant title Statistical metrology
General note"IEEE Catalog Number 98EX113"--verso of T.p.
Bibliography noteIncludes bibliographical references.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 97080378
ISBN0780343387 (softbound)
ISBN0780343395 (microfiche)