Journey to data quality / Yang W. Lee ... [et al.].

Other author Lee, Yang W.
Format Electronic
Publication InfoCambridge, Mass. : MIT Press,
Descriptionxii, 226 p. : ill. ; 24 cm.
Supplemental ContentFull text available from Ebook Central - Academic Complete
Supplemental ContentFull text available from eBooks on EBSCOhost
Supplemental ContentFull text available from MIT Press Direct to Open Backfile STEAM Monographs D2O
Supplemental ContentFull text available from Ebook Central - Public Library Complete
Subjects
Business--Data processing. --Management.
Database management--Quality control.

Bibliography noteIncludes bibliographical references (p. [215]-221) and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2006043331
ISBN0262122871 (alk. paper)
ISBN9780262122870 (alk. paper)