Markov random field modeling in image analysis / Stan Z. Li.

SeriesAdvances in pattern recognition, 1617-7916
Bibliography noteIncludes bibliographical references (p. 315-350) and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2008943235
ISBN9781848002784 (hbk.)
ISBN1848002785 (hbk.)
ISBN9781848002791
ISBN1848002793
Publisher number12203222

Availability

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Electronic Resources ✔ Available