MTDT 2009 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan.
| Author/creator | IEEE International Workshop on Memory Technology, Design, and Testing |
| Other author | IEEE Computer Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | xxii, 95 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Subjects |
| Portion of title | Memory Technology, Design, and Testing |
| Cover title | Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing |
| General note | "IEEE Computer Society order number P3797"--T.p. verso. |
| General note | MTDT 2009 is the 17th conference based on numbering of previous conferences. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2010484146 |
| ISBN | 9780769537979 (pbk.) |
| ISBN | 0769537979 (pbk.) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |