MTDT 2009 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan.

Portion of title Memory Technology, Design, and Testing
Cover title Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing
General note"IEEE Computer Society order number P3797"--T.p. verso.
General noteMTDT 2009 is the 17th conference based on numbering of previous conferences.
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2010484146
ISBN9780769537979 (pbk.)
ISBN0769537979 (pbk.)