Pattern Recognition with Support Vector Machines Proceedings of the First International Workshop, SVM 2002, Niagara Falls, Canada, August 202: Proceedings

Author/creator Lee, S. W. Editor
Other author Verri, Alessandro Editor
Format Electronic
Publication InfoNew York : Springer
DescriptionXI, 420 p. ill 23.500 x 015.500 cm.
Supplemental ContentFull text available from Springer Books
Supplemental ContentFull text available from SpringerLINK Lecture Notes in Computer Science Contemporary (1997-present)
Subjects

SeriesLecture Notes in Computer Science Vol. 2388
Summary Annotation This book constitutes the refereed proceedings of the First International Workshop on Pattern Recognition with Support Vector Machines, SVM 2002, held in Niagara Falls, Canada in August 2002.The 16 revised full papers and 14 poster papers presented together with two invited contributions were carefully reviewed and selected from 57 full paper submissions. The papers presented span the whole range of topics in pattern recognition with support vector machines from computational theories to implementations and applications.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2002026906
ISBN9783540440161
ISBN354044016X (Trade Paper) Active Record
Standard identifier# 9783540440161
Stock number354044016X 00024965

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