Proceedings / International Test Conference 1997.

Author/creator International Test Conference
Other author IEEE Computer Society. Test Technology Technical Committee.
Other author Institute of Electrical and Electronics Engineers. Philadelphia Section.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoWashington, D.C. : The Conference,
Descriptionxiv, 1054 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Conference Proceedings Archive
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Integrated circuits--Testing. --Congresses.
Electronic digital computers--Circuits. --Testing. --Congresses.

General note"Sponsored by IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section"--Cover.
General note"November 1-6, 1997 ... Washington, D.C., USA"--Cover
General note"IEEE catalog number 97CH36126"--T.p. verso.
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 98159242
ISBN0780342100 (casebound)
ISBN0780342097 (softbound)
ISBN0780342119 (microfiche)
ISBN0780342127 (CD-ROM)