/LC.GIF&client=easterncarolinaedu)
Proceedings / International Test Conference 1994.
| Author/creator | International Test Conference |
| Other author | Institute of Electrical and Electronics Engineers. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Altoona, PA : The Conference ; Piscataway, N.J. : Can be ordered from IEEE Service Center, |
| Description | xii, 1033 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| General note | Cover title: TEST, the next 25 years. |
| General note | Spine title: IEEE International Test Conference 1994. |
| General note | "IEEE catalog number 94CH34835"--T.p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| Other title | TEST, the next 25 years. |
| LCCN | 94078172 |
| ISBN | 0780321030 (casebound) |
| ISBN | 0780321022 (softbound) |
| ISBN | 0780321049 (microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |