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Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test Technology.
| Author/creator | IEEE International Workshop on Memory Testing |
| Other author | Rajsuman, Rochit. |
| Other author | IEEE Computer Society. Test Technology Technical Committee. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society Press, |
| Description | ix, 143 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| General note | "IEEE catalog number 93TH0554-6"--T.p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 93077854 |
| ISBN | 0818641509 (paper) |
| ISBN | 0818641517(microfiche) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |