Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California / edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI in cooperation with the IEEE Solid State Circuits Council.
| Author/creator | IEEE International Workshop on Memory Technology, Design, and Testing |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society Press, |
| Description | ix, 129 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Other author/creator | Rajsuman, Rochit. |
| Other author/creator | Rajkanan, K. (Kamal) |
| Other author/creator | IEEE Computer Society. Test Technology Technical Committee. |
| Other author/creator | IEEE Computer Society. Technical Committee on VLSI. |
| Other author/creator | IEEE Solid-State Circuits Council. |
| Other author/creator | IEEE Xplore (Online service) |
| General note | "IEEE catalog number 95TH8065"--T.p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 95075673 |
| ISBN | 0818671025 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |