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010 a| 94075844;

020 a| 081866245X (paper);

020 a| 0818662468 (microfiche);

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040 a| DLCc| DLCd| DLCd| WaSeSS;

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050 00 a| TK7895.M4b| I334 1994;

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111 2 a| IEEE International Workshop on Memory Technology, Design, and Testingd| (1994 :c| San Jose, Calif.)?| UNAUTHORIZED;

245 10 a| Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, Californiah| [electronic resource] /c| edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI.;

260 a| Los Alamitos, Calif. :b| IEEE Computer Society Press,;

300 a| ix, 141 p. :b| ill. ;c| 28 cm.;

500 a| "IEEE catalog number 94TH0656-9"--T.p. verso.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Semiconductor storage devicesx| Testingx| Congresses.=| ^A90527;

650 0 a| Random access memoryx| Congresses.=| ^A429975;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Rajsuman, Rochit.=| ^A819579;

710 2 a| IEEE Computer Society.b| Test Technology Technical Committee.=| ^A724761;

710 2 a| IEEE Computer Society.b| Technical Committee on VLSI.=| ^A559676;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D3170;

856 40 z| Full text available from IEEE Conference Proceedings Archiveu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D3170;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D3170;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

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999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4251882-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 1/4/2016x| EBOOKz| JERESOURCE;

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI.

Author/creator	IEEE International Workshop on Memory Technology, Design, and Testing
Format	Electronic
Publication Info	Los Alamitos, Calif. : IEEE Computer Society Press,
Description	ix, 141 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Supplemental Content	Full text available from IEEE Conference Proceedings Archive
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects	Semiconductor storage devices--Testing. --Congresses. Random access memory--Congresses.

Other author/creator	Rajsuman, Rochit.
Other author/creator	IEEE Computer Society. Test Technology Technical Committee.
Other author/creator	IEEE Computer Society. Technical Committee on VLSI.
Other author/creator	IEEE Xplore (Online service)
General note	"IEEE catalog number 94TH0656-9"--T.p. verso.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	94075844
ISBN	081866245X (paper)
ISBN	0818662468 (microfiche)

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL)	✔ Available

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI.

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