Semiconductors and Semimetals Vol. 28: Measurement of High-Speed Signals in Solid State Devices
| Author/creator | Willardson, Robert K. Editor |
| Other author | Beer, Albert C. Editor |
| Other author | Marcus, Robert B. Editor |
| Format | Electronic |
| Publication Info | Academic Press [Imprint] San Diego : Elsevier Science & Technology Books |
| Description | 438 p. ill |
| Supplemental Content | Full text available from Book Series Backfile Package - Physics and Astronomy [YBPHAS] |
| Subjects |
| Summary | Annotation Operating speeds near 1 ps and dimensions well below 1 micron dictate the need for non-invasive probes. This book discusses the current status of methods developed to perform such measurements. Most of the techniques are "contactless" and most make use of sampling methods requiring synchronization and signal averaging to obtain a satisfactory signal-to-noise ratio. Discusses photoconductive, electrooptic, electron beam, photoemissive probing, contact probing. Annotation copyrighted by Book News, Inc., Portland, OR |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 85642319 |
| ISBN | 9780127521282 |
| ISBN | 0127521283 (Trade Cloth) Out of Print |
| Standard identifier# | 9780127521282 |
| Stock number | 00991439 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |