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245 00 a| Stress-induced phenomena in metallizationh| [electronic resource] :b| first international workshop, Ithaca, NY, 1991 /c| editors, Che-Yu Li, Paul Totta, Paul Ho.;

260 a| New York :b| American Institute of Physics,;

300 a| vii, 280 p. :b| ill. ;c| 25 cm.;

440 0 a| American Vacuum Society series ;v| 13;

490 1 a| Conference proceedings ;v| no. 263;

500 a| "DOE CONF-9109327"--T.p. verso.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Semiconductorsx| Defectsx| Congresses.=| ^A41977;

650 0 a| Metallic filmsx| Congresses.=| ^A462329;

650 0 a| Thin film devicesx| Defectsx| Congresses.=| ^A125060;

650 0 a| Aluminum filmsx| Congresses.?| UNAUTHORIZED;

650 0 a| Metallizingx| Congresses.=| ^A1022611;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Li, Che-Yu.=| ^A241676;

700 1 a| Totta, Paul.?| UNAUTHORIZED;

700 1 a| Ho, P. S.?| UNAUTHORIZED;

830 0 a| AIP conference proceedings ;v| no. 263.=| ^A24766;

856 40 z| Full text available from AIP Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fpubs.aip.org%2Faip%2Facp%2Fissue%2F263%2F1;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 4288682;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4288682-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 1/4/2016x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4288682-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 1/4/2016x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4288682-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 1/4/2016x| EBOOKz| JERESOURCE;

Stress-induced phenomena in metallization first international workshop, Ithaca, NY, 1991 / editors, Che-Yu Li, Paul Totta, Paul Ho.

Other author	Li, Che-Yu.
Other author	Totta, Paul.
Other author	Ho, P. S.
Format	Electronic
Publication Info	New York : American Institute of Physics,
Description	vii, 280 p. : ill. ; 25 cm.
Supplemental Content	Full text available from AIP Conference Proceedings
Subjects	Semiconductors--Defects. --Congresses. Metallic films--Congresses. Thin film devices--Defects. --Congresses. Aluminum films--Congresses. Metallizing--Congresses.

Series	American Vacuum Society series ; 13 Conference proceedings ; no. 263 AIP conference proceedings ; no. 263. ^A24766
General note	"DOE CONF-9109327"--T.p. verso.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	92072292
ISBN	1563960826

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Stress-induced phenomena in metallization first international workshop, Ithaca, NY, 1991 / editors, Che-Yu Li, Paul Totta, Paul Ho.

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