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LEADER 02658cam 2200589Ii 4500

001 ocm41247576;

003 OCoLC;

005 20220726155311.0;

007 he bmu024bbua;

008 990426s1997 nyua b f000 0 eng d;

035 a| (Sirsi) o41247576;

035 a| tmp97145651;

037 a| 19980209882b| NASA;

049 a| ERE$;

074 a| 0830-D (MF);

086 0 a| NAS 1.15:207869;

100 1 a| Palosz, W.,e| author.?| UNAUTHORIZED;

245 10 a| Characterization of cadmium-zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topography /c| W. Palosz [and others].;

264 2 a| Springfield, VA :b| National Technical Information Service, Distributor;

300 a| 14 pages :b| illustrations.;

336 a| textb| txt2| rdacontent;

337 a| microformb| h2| rdamedia;

338 a| microficheb| he2| rdacarrier;

490 1 a| NASA/TM ;v| 207869;

500 a| Shipping list no.: 99-0384-M.;

500 a| "Oct 26 1998"--Microfiche header.;

500 a| GPO Cataloging Record Distribution Program (CRDP).;

650 0 a| Crystal growth.=| ^A50853;

650 0 a| Cadmium telluride.=| ^A1123718;

650 0 a| Zinc telluride.=| ^A999966;

650 7 a| Crystal growth.2| nasat;

650 7 a| Cadmium tellurides.2| nasat;

650 7 a| Zinc tellurides.2| nasat;

650 7 a| Topography.2| nasat;

650 7 a| Crystal defects.2| nasat;

650 7 a| Edge dislocations.2| nasat;

650 7 a| Characterization.2| nasat;

650 7 a| Laue method.2| nasat;

650 7 a| Cadmium telluride.2| fast0| (OCoLC)fst01893100;

650 7 a| Crystal growth.2| fast0| (OCoLC)fst00884619;

650 7 a| Zinc telluride.2| fast0| (OCoLC)fst01184451;

710 1 a| United States.b| National Aeronautics and Space Administratione| production company.=| ^A5437;

710 1 a| United States.b| National Technical Information Service,e| distributor.=| ^A84913;

776 08 i| Online version:a| Palosz, Witold.t| Characterization of cadmium-zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topographyw| (OCoLC)1315489717;

830 0 a| NASA technical memorandum ;v| 207869.=| ^A467613;

949 a| NAS 1.15:207869w| sudoch| joyner32;

596 a| 1;

998 a| 4474144;

999 a| NAS 1.15:207869w| SUDOCc| 1i| 4474144-1001l| JDOMIm| JOYNERr| Ys| Yt| JDOFMIu| 7/18/2016x| MICROFORMz| JFEDDOCSo| .STAFF. jjlm;

Characterization of cadmium-zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topography / W. Palosz [and others].

Author/creator	Palosz, W. author.
Other author	United States. National Aeronautics and Space Administration production company.
Other author	United States. National Technical Information Service, distributor.
Format	Microform
Publication	[New York] : Elsevier ; [Washington, DC] : [National Aeronautics and Space Administration], [1997]
Distribution	Springfield, VA : National Technical Information Service, Distributor
Description	14 pages : illustrations.
Subjects	Crystal growth. Cadmium telluride. Zinc telluride.

Series	NASA/TM ; 207869 NASA technical memorandum ; 207869. ^A467613
General note	Shipping list no.: 99-0384-M.
General note	"Oct 26 1998"--Microfiche header.
General note	GPO Cataloging Record Distribution Program (CRDP).
Reproduction note	Microfiche. [Washington, D.C.] : [National Aeronautics and Space Administration], 1998. 1 microfiche : negative ; 4 x 6 in.
Issued in other form	Online version: Palosz, Witold. Characterization of cadmium-zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topography
GPO item number	0830-D (MF)
Govt. docs number	NAS 1.15:207869
Stock number	19980209882 NASA

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Library	Location	Call Number	Status	Item Actions
Joyner	Microforms B300	NAS 1.15:207869	✔ Available

Characterization of cadmium-zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topography / W. Palosz [and others].

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