ISTFA 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis

Other author ASM International Staff.
Other author Electronic Device Failure Analysis Society Staff.
Format Electronic
Publication InfoMaterials Park : A S M International
Description500 p. ill
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects

Summary Annotation This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, 'Follow the Data'.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9781627081023
ISBN162708102X (Trade Paper) Active Record
Stock number00001651

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available