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001 ocn957491374;

003 OCoLC;

005 20161024093852.0;

006 m o d ;

007 cr unu||||||||;

008 160829s2016 ncua obm 000 0 eng d;

035 a| (Sirsi) o957491374;

035 a| (OCoLC)957491374;

049 a| EREE;

090 a| QC787.E42;

100 1 a| Hawkins, Wilson L.,e| author.?| UNAUTHORIZED;

245 12 a| A new electron spectroscopy system for measuring electron emission from fast ion interactions with atomic, molecular, and condensed phase targets /c| by Wilson L. Hawkins.;

264 1 a| [Greenville, N.C.] :b| [East Carolina University],c| 2016.;

300 a| 61 pages :b| illustrations (some color);

336 a| textb| txt2| rdacontent;

337 a| computerb| c2| rdamedia;

338 a| online resourceb| cr2| rdacarrier;

347 a| text fileb| PDFc| 3.27 MB2| rda;

538 a| System requirements: Adobe Reader.;

538 a| Mode of access: World Wide Web.;

502 b| M.S.c| East Carolina Universityd| 2016.;

500 a| Presented to the faculty of the Department of Physics.;

500 a| Advisor: Jefferson L. Shinpaugh.;

500 a| Title from PDF t.p. (viewed September 12, 2016).;

520 3 a| A new electron spectroscopy system has been developed for measuring electron emission from gas and solid targets induced by fast ion impact. This system uses an ultrahigh-vacuum compatible cylindrical deflector analyzer, designed and fabricated in the Department of Physics at East Carolina University, to measure electron yields as a function of electron energy and emission angle for fast ions interacting with materials. The new spectroscopy system was tested in a previously existing high-vacuum target chamber that has been installed on a new beam line in the ECU Accelerator Laboratory. In addition to the new analyzer, a new data acquisition and experimental control system, based on LabVIEW computer control software, was developed and tested using an existing cylindrical mirror analyzer. Data from this system was compared to previous results to confirm the functionality of the design. Subsequently, the new analyzer was installed in the high-vacuum target chamber and tested by measuring Auger electron emission from 2 MeV protons incident on an argon gas target and comparing to well-known emission spectra. Ultimately, the new electron spectroscopy system will be used for measuring electron yields from condensed phase targets in ultrahigh-vacuum conditions in future experiments.;

504 a| Includes bibliographical references.;

650 0 a| Electrostatic analyzers.=| ^A1304549;

650 0 a| Electron spectroscopy.=| ^A88630;

650 0 a| Electronsx| Emission.=| ^A283789;

653 a| Auger Electrons;

653 a| Fast Ion Interactions;

653 a| Particle Accelerator;

700 1 a| Shinpaugh, Jefferson L.,e| degree supervisor.?| UNAUTHORIZED;

710 2 a| East Carolina University.b| Department of Physics.?| UNAUTHORIZED;

856 40 z| Access via ScholarShipu| http://hdl.handle.net/10342/5925;

949 o| wjh;

994 a| C0b| ERE;

596 a| 1 4;

998 a| 4511323;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4511323-1001l| JNETm| JOYNERr| Ys| Yt| JNE3ETDu| 8/29/2016x| ETDz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4511323-2001l| HSLELECm| HSLr| Ys| Yt| HEETDu| 8/29/2016x| ETDz| HERESOURCE;

A new electron spectroscopy system for measuring electron emission from fast ion interactions with atomic, molecular, and condensed phase targets / by Wilson L. Hawkins.

Author/creator	Hawkins, Wilson L. author.
Other author	Shinpaugh, Jefferson L., degree supervisor.
Other author	East Carolina University. Department of Physics.
Format	Theses and dissertations
Publication	[Greenville, N.C.] : [East Carolina University], 2016.
Description	61 pages : illustrations (some color)
Supplemental Content	Access via ScholarShip
Subjects	Electrostatic analyzers. Electron spectroscopy. Electrons--Emission.

Summary	A new electron spectroscopy system has been developed for measuring electron emission from gas and solid targets induced by fast ion impact. This system uses an ultrahigh-vacuum compatible cylindrical deflector analyzer, designed and fabricated in the Department of Physics at East Carolina University, to measure electron yields as a function of electron energy and emission angle for fast ions interacting with materials. The new spectroscopy system was tested in a previously existing high-vacuum target chamber that has been installed on a new beam line in the ECU Accelerator Laboratory. In addition to the new analyzer, a new data acquisition and experimental control system, based on LabVIEW computer control software, was developed and tested using an existing cylindrical mirror analyzer. Data from this system was compared to previous results to confirm the functionality of the design. Subsequently, the new analyzer was installed in the high-vacuum target chamber and tested by measuring Auger electron emission from 2 MeV protons incident on an argon gas target and comparing to well-known emission spectra. Ultimately, the new electron spectroscopy system will be used for measuring electron yields from condensed phase targets in ultrahigh-vacuum conditions in future experiments.
General note	Presented to the faculty of the Department of Physics.
General note	Advisor: Jefferson L. Shinpaugh.
General note	Title from PDF t.p. (viewed September 12, 2016).
Dissertation note	M.S. East Carolina University 2016.
Bibliography note	Includes bibliographical references.
Technical details	System requirements: Adobe Reader.
Technical details	Mode of access: World Wide Web.

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A new electron spectroscopy system for measuring electron emission from fast ion interactions with atomic, molecular, and condensed phase targets / by Wilson L. Hawkins.

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