/LC.GIF&client=easterncarolinaedu)
VLSI test principles and architectures design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
| Other author | Wang, Laung-Terng. |
| Other author | Wu, Cheng-Wen, EE Ph. D. |
| Other author | Wen, Xiaoqing. |
| Format | Electronic |
| Publication Info | Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, |
| Description | xxx, 777 p. : ill. ; 25 cm. |
| Supplemental Content | Full text available from Ebook Central - Academic Complete |
| Supplemental Content | Full text available from eBook - Computer Science 1995 - 2006 |
| Subjects |
| Series | The Morgan Kaufmann series in systems on silicon |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2006006869 |
| ISBN | 0123705975 (hardcover : alk. paper) |
| ISBN | 9780123705976 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |