7th International On-Line Testing Workshop, 2001, Giardini Naxos, Taormina, Italy
| Author/creator | IEEE Computer Society Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 228 p. ill 28.000 x 022.000 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation From the July 2001 conference in Taormina, Italy, these proceedings comprise 37 papers and ten posters. The papers cover the following topics: dependability evaluation; on-line testing for reconfiguration systems; on-line testable and fault tolerable circuits and systems; yield, test, and reliability issues for very deep submicron chips; logic verification for on-line tested systems; built-in self-testing; self-checking, concurrent detection, and radiation effects; automotive applications and on-line monitoring of temperature; self-checking circuits and error control coding implementation; hardware and software techniques for fault tolerance; applications; and, on-line testing of digital, analog, and mixed signal circuits. c. Book News Inc. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2001092275 |
| ISBN | 9780769512907 |
| ISBN | 0769512909 (Trade Paper) Active Record |
| Stock number | 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |