Integrated circuit defect-sensitivity : theory and computational models / by José Pineda de Gyvez.

Author/creator Pineda de Gyvez, José
Format Book
Publication InfoBoston : Kluwer Academic Publishers, ©1993.
Descriptionxxiv, 167 pages : illustrations ; 25 cm.
Subjects
Integrated circuits--Very large scale integration. --Design and construction. --Data processing.
Integrated circuits--Very large scale integration. --Defects. --Mathematical models.
Computer-aided design.

SeriesKluwer international series in engineering and computer science. Microelectronics manufacturing
Kluwer international series in engineering and computer science ; SECS 208
Kluwer international series in engineering and computer science SECS 208. ^A664937
Kluwer international series in engineering and computer science. Microelectronics manufacturing. ^A310419
Bibliography noteIncludes bibliographical references (p. 138-146) and index.
LCCN 92035547
ISBN0792393066 (acid-free paper)