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010 a| 00111492;

020 a| 0780366883 (softbound);

035 a| (WaSeSS)ssj0000454484;

040 a| MoKLc| MoKLd| DLCd| WaSeSS;

042 a| lccopycat;

049 a| EREEa| NEHH;

050 00 a| TK7871.85b| .I58443 2001;

111 2 a| International Workshop on Statistical Methodologyn| (6th :d| 2001 :c| Kyoto, Japan)?| UNAUTHORIZED;

245 10 a| 2001 6th International Workshop on Statistical Methodologyh| [electronic resource] :b| IWSM : June 10, 2001/Kyoto /c| technical co-sponsored by IEEE Electron Devices Society ... [et al.].;

260 a| Piscataway, N.J. :b| IEEE,;

300 a| vi, 67 p. :b| ill. ;c| 28 cm.;

500 a| "IEEE Cat. No. 01TH8550"--T.p.;

504 a| Includes bibliographic references.;

506 a| Available only to authorized users.;

530 a| Also available via the World Wide Web.;

538 a| Mode of access: World Wide Web;

650 0 a| Semiconductorsx| Measurementv| Congresses.=| ^A16124;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Electron Devices Society.=| ^A85580;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D7426;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D7426;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

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596 a| 1 3 4;

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999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4666123-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 3/19/2017x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4666123-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 3/19/2017x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4666123-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 3/19/2017x| EBOOKz| JERESOURCE;

2001 6th International Workshop on Statistical Methodology IWSM : June 10, 2001/Kyoto / technical co-sponsored by IEEE Electron Devices Society ... [et al.].

Author/creator	International Workshop on Statistical Methodology
Other author	IEEE Electron Devices Society.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Piscataway, N.J. : IEEE,
Description	vi, 67 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects	Semiconductors--Characterization. --Statistical methods. --Congresses. Semiconductors--Measurement. --Congresses.

General note	"IEEE Cat. No. 01TH8550"--T.p.
Bibliography note	Includes bibliographic references.
Access restriction	Available only to authorized users.
Other forms	Also available via the World Wide Web.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	00111492
ISBN	0780366883 (softbound)

2001 6th International Workshop on Statistical Methodology IWSM : June 10, 2001/Kyoto / technical co-sponsored by IEEE Electron Devices Society ... [et al.].

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