Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2001 / edited by Wilson TAN ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Device Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore [and] Institute of Microelectronics, Singapore.
| Author/creator | International Symposium on the Physical & Failure Analysis of Integrated Circuits |
| Other author | Tan, Wilson. |
| Other author | IEEE Reliability/CPMT/ED Singapore Chapter. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, NJ : Institute of Electrical and Electronics Engineers, |
| Description | 262 p. : ill. ; 30 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Cover title | IPFA 2001 proceedings |
| General note | Issues for 18th (2011)- cataloged as a serial in LC. |
| General note | "IEEE catalog number 01TH8548"--Verso t.p. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 00110824 |
| ISBN | 0780366751 |