2002 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

Author/creator International Integrated Reliability Workshop
Other author IEEE Electron Devices Society.
Other author IEEE Reliability Society.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoPiscataway, N.J. : IEEE Society,
Descriptionv, 214 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Integrated circuits--Reliability. --Congresses.
Integrated circuits--Wafer-scale integration. --Reliability. --Congresses.

General note"IEEE Catalog Number 02TH8634."
Bibliography noteIncludes bibliographical references.
Access restrictionAvailable only to authorized users.
Other formsAlso available via the World Wide Web.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2002106802
ISBN0780375580