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082 00 a| 621.38152| 22;

111 2 a| International Integrated Reliability Workshopd| (2003 :c| Lake Tahoe, California)?| UNAUTHORIZED;

245 10 a| 2003 IEEE International Integrated Reliability Workshop final reporth| [electronic resource] :b| Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003 /c| sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.;

250 a| Softbound ed.;

260 a| Piscataway, New Jersey :b| IEEE Society,;

300 a| viii, 182 p. :b| ill. ;c| 28 cm.;

500 a| "IEEE Catalog Number: 03TH8715"--T.p. verso.;

500 a| ISBN from label on t.p. verso of copy 1.;

504 a| Includes bibliographic references.;

506 a| Available only to authorized users.;

530 a| Also available via the World Wide Web.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Reliability.v| Congresses.=| ^A213873;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Electron Devices Society.=| ^A85580;

710 2 a| IEEE Reliability Society.=| ^A725831;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D9026;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D9026;

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596 a| 1 3 4;

998 a| 4666407;

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999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4666407-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 3/19/2017x| EBOOKz| JERESOURCE;

2003 IEEE International Integrated Reliability Workshop final report Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

Author/creator	International Integrated Reliability Workshop
Other author	IEEE Electron Devices Society.
Other author	IEEE Reliability Society.
Other author	IEEE Xplore (Online service)
Format	Electronic
Edition	Softbound ed.
Publication Info	Piscataway, New Jersey : IEEE Society,
Description	viii, 182 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Subjects	Integrated circuits--Reliability. --Congresses. Integrated circuits--Wafer-scale integration. --Reliability. --Congresses.

General note	"IEEE Catalog Number: 03TH8715"--T.p. verso.
General note	ISBN from label on t.p. verso of copy 1.
Bibliography note	Includes bibliographic references.
Access restriction	Available only to authorized users.
Other forms	Also available via the World Wide Web.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2003110309
ISBN	0780381572

2003 IEEE International Integrated Reliability Workshop final report Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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