Defect and Fault-Tolerance in VLSI Systems (DFT 2001) 2001 International Symposium
| Author/creator | IEEE Computer Society Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | I E E E [Imprint] Los Alamitos : IEEE Computer Society Press |
| Description | 420 p. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation Taken from the October 2001 San Francisco conference, 55 papers discuss water scale, yield, dependable design, testing techniques, fault-tolerance in arrays, fault detection, FPGA based applications, fault injection, error correcting codes, mixed signal circuits, defect analysis, self-checking and failsafe circuits, and fault-tolerant techniques. An abstract accompanies each paper. Contributors are primarily computer scientists and electrical engineers. Indexed by author only (not by subject). c. Book News Inc. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9780769512037 |
| ISBN | 0769512038 (Trade Paper) Active Record |
| Standard identifier# | 9780769512037 |
| Stock number | 00029433 |